Precautions for using the wafer testing temperature control system
The wafer testing temperature control system can provide high and low temperature environments for experimental use. However, as an instrument, its operation also needs to follow certain precautions. This article will introduce in detail the operating precautions of the wafer testing temperature control system to ensure the accuracy and safety of the experiment.
The wafer testing temperature control system mainly consists of a refrigeration system, a heating system, a control system and a temperature sensor. It can achieve accurate control of high and low temperature environments by adjusting the parameters of the heating system and refrigeration system.
FLT-100℃~90℃
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Before using the wafer to test the temperature control system, we need to conduct a series of checks. Check whether the power connection of the device is normal and whether the power plug is tight. Secondly, check whether the pipeline connections of the equipment are tight and whether there are leaks. In addition, the internal cleanliness of the equipment should be checked to ensure the accuracy of the experimental results.
When operating the wafer testing temperature control system, we need to pay attention to the following tips. Avoid moving or tilting the equipment while it is in operation to avoid unnecessary injury. Secondly, make sure that the experimental samples are placed securely and do not place them on the edge or sliding parts of the equipment to avoid falling and damaging the equipment or causing personal injury.
When setting the temperature, adjust the temperature step by step and always pay attention to the difference between the device’s display temperature and the set temperature. If the difference is too large, the parameters of the heating system and refrigeration system should be adjusted in time. At the same time, it is necessary to keep the equipment clean and clean the condenser, evaporator and other components regularly to ensure the heat dissipation and cooling effect of the equipment.
Long-term use of the wafer test temperature control system may result in equipment performance degradation or failure. Therefore, we must regularly inspect and maintain the equipment to detect and solve problems in a timely manner. At the same time, the filter, oil and other accessories of the equipment should be replaced regularly according to the equipment instructions to ensure the normal operation of the equipment.
In short, the operation of the wafer testing temperature control system requires attention to many aspects. During use, we must strictly abide by the operating procedures of the equipment and always pay attention to the operating status of the equipment and changes in experimental results. At the same time, you also need to pay attention to tips and equipment maintenance precautions to ensure the accuracy and safety of the experiment.
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